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Dislocations are related to the thermal shear stresses generated during crystal growth which, beyond a critical level, called the CRSS (Critical Resolved Shear Stress), give rise to plastic deformations.
The ratio of the von Mises invariant over the CRSS allows to determine the excess stress field, ie. the crystal regions where a high probability of dislocation generation is observed.
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Ratio of the von Mises invariant to the CRSS (excess stress field) in the crystal: top, <1,0,0> crystal; bottom, <1,1,1> crystal.
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